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Sequential Testing of k-out-of-n Systems with Imperfect Tests
Wei, Wenchao, Coolen, Kris, Nobibon, F. Talla, Leus, R.Year:
2015
Language:
english
Journal:
SSRN Electronic Journal
DOI:
10.2139/ssrn.2585404
File:
PDF, 496 KB
english, 2015