Characterization of vapor phase deposited organic molecules...

Characterization of vapor phase deposited organic molecules on silicon surfaces

S. Dieckhoff, R. Höper, V. Schlett, T. Gesang, W. Possart, O.-D. Hennemann, J. Günster, V. Kempter
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Volume:
358
Language:
english
Pages:
5
DOI:
10.1007/s002160050400
Date:
May, 1997
File:
PDF, 273 KB
english, 1997
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