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[IEEE 2018 IEEE 27th Asian Test Symposium (ATS) - Hefei, China (2018.10.15-2018.10.18)] 2018 IEEE 27th Asian Test Symposium (ATS) - On Flip-Flop Selection for Multi-cycle Scan Test with Partial Observation in Logic BIST
Oshima, Shigeyuki, Kato, Takaaki, Wang, Senling, Sato, Yasuo, Kajihara, SeijiYear:
2018
Language:
english
DOI:
10.1109/ATS.2018.00017
File:
PDF, 520 KB
english, 2018