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[IEEE 2018 IEEE 27th Asian Test Symposium (ATS) - Hefei, China (2018.10.15-2018.10.18)] 2018 IEEE 27th Asian Test Symposium (ATS) - Capture-Pattern-Control to Address the Fault Detection Degradation Problem of Multi-cycle Test in Logic BIST
Wang, Senling, Aono, Tomoki, Higami, Yoshinobu, Takahashi, Hiroshi, Iwata, Hiroyuki, Maeda, Yoichi, Matsushima, JunYear:
2018
Language:
english
DOI:
10.1109/ATS.2018.00038
File:
PDF, 403 KB
english, 2018