[IEEE 2018 2nd International Conference on Trends in Electronics and Informatics (ICOEI) - Tirunelveli, India (2018.5.11-2018.5.12)] 2018 2nd International Conference on Trends in Electronics and Informatics (ICOEI) - Image Based Defect Analysis Using NDT
Kathir, N.S., Srinath, G., Kumar, T. Rajesh, Prabhakaran, M.Year:
2018
Language:
english
DOI:
10.1109/ICOEI.2018.8553925
File:
PDF, 367 KB
english, 2018