Clarification by TEM and SIMS of abnormal Ti depth...

Analytical and Bioanalytical Chemistry 2001 / 09 Vol. 371; Iss. 1

Clarification by TEM and SIMS of abnormal Ti depth distribution in chemical solution-deposited SrTiO3/La0.5Sr0.5CoO3

C. Pollak, H. Hutter, P. Warbichler, K. Reichmann
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Volume:
371
Language:
english
Pages:
4
DOI:
10.1007/s002160100922
Date:
September, 2001
File:
PDF, 140 KB
english, 2001
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