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Physical Scaling Limits of FinFET Structure: A Simulation Study
Saini, Gaurav, K Rana, AshwaniVolume:
2
Language:
english
Journal:
International Journal of VLSI Design & Communication Systems
DOI:
10.5121/vlsic.2011.2103
Date:
March, 2011
File:
PDF, 314 KB
english, 2011