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[IEEE 2018 Workshop on Fault Diagnosis and Tolerance in Cryptography (FDTC) - Amsterdam, Netherlands (2018.9.13-2018.9.13)] 2018 Workshop on Fault Diagnosis and Tolerance in Cryptography (FDTC) - Random Numbers Generation: Tests and Attacks

Guilley, Sylvain, El Housni, Youssef
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Year:
2018
Language:
english
DOI:
10.1109/FDTC.2018.00016
File:
PDF, 648 KB
english, 2018
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