Characterization of Fine-Pixel X-Ray Imaging Detector Array Fabricated by Using Thick Single-Crystal CdTe Layers on Si Substrates Grown by MOVPE
Niraula, Madan, Yasuda, Kazuhito, Tsubota, Shintaro, Yamaguchi, Taiki, Ozawa, Junya, Mori, Takuro, Agata, YasunoriYear:
2018
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2018.2883325
File:
PDF, 1.52 MB
english, 2018