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Automatic Fault Detection Circuit for Integrated Gate Drivers of Active-Matrix Displays
Yu, Byung-Chang, Kim, Jongbin, Lee, Seung-Hyuck, Chung, Hoon-Ju, Lee, Seung-WooYear:
2018
Language:
english
Journal:
IEEE Journal of the Electron Devices Society
DOI:
10.1109/jeds.2018.2885529
File:
PDF, 986 KB
english, 2018