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[ACM Press the 2018 International Conference - Tianjin, China (2018.09.19-2018.09.21)] Proceedings of the 2018 International Conference on Electronics and Electrical Engineering Technology - EEET '18 - Reliability Evaluation of Complex Equipment Based on Virtual Samples and Performance Degradation
Zhao, Xinchao, Lv, WeiminYear:
2018
Language:
english
DOI:
10.1145/3277453.3277477
File:
PDF, 792 KB
english, 2018