A New Multi-site Test for System-on-Chip Using Multi-site...

ETRI Journal 2014 / 04 Vol. 36; Iss. 2

A New Multi-site Test for System-on-Chip Using Multi-site Star Test Architecture

Han, Dongkwan, Lee, Yong, Kang, Sungho
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Volume:
36
Journal:
ETRI Journal
DOI:
10.4218/etrij.14.0113.0469
Date:
April, 2014
File:
PDF, 260 KB
2014
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