[IEEE IECON 2018 - 44th Annual Conference of the IEEE Industrial Electronics Society - D.C., DC, USA (2018.10.21-2018.10.23)] IECON 2018 - 44th Annual Conference of the IEEE Industrial Electronics Society - Selection and Recognition of Statistically Defined Signals in Learning Systems
Bezruk, Valeriy, Omelchenko, Anatolii, Fedorov, Oleksii, Mercorelli, Paolo, Nieto Hipolito, Juan IvanYear:
2018
DOI:
10.1109/IECON.2018.8591321
File:
PDF, 1.01 MB
2018