[IEEE 2018 19th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM) - Erlagol (Altai Republic), Russia (2018.6.29-2018.7.3)] 2018 19th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM) - The Analytical Dependence of the Range from the Angular Position of the Line-of-Sight for an Object Represented as Several Planes
Nikulin, Andrey V., Artyushenko, Vadim V.Year:
2018
DOI:
10.1109/edm.2018.8434965
File:
PDF, 289 KB
2018