Stacking fault reduction during annealing in Cu-poor...

Journal of Applied Physics 2019 / 01 Vol. 125; Iss. 3

Stacking fault reduction during annealing in Cu-poor CuInSe 2 thin film solar cell absorbers analyzed by in situ XRD and grain growth modeling

Stange, Helena, Brunken, Stephan, Greiner, Dieter, Heinemann, Marc Daniel, Barragan Yani, Daniel Antonio, Wägele, Leonard Alwin, Li, Chen, Simsek Sanli, Ekin, Kahnt, Max, Schmidt, Sebastian Simon, Bäc
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Volume:
125
Journal:
Journal of Applied Physics
DOI:
10.1063/1.5052245
Date:
January, 2019
File:
PDF, 2.60 MB
2019
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