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A Comparative Study of E-Beam Deposited Gate Dielectrics on Channel Width-Dependent Performance and Reliability of a-IGZO Thin-Film Transistors
Wu, Gwomei, Sahoo, Anup, Chen, Dave, Chang, J.Volume:
11
Journal:
Materials
DOI:
10.3390/ma11122502
Date:
December, 2018
File:
PDF, 3.16 MB
2018