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Short-Circuit Robustness of SiC Trench MOSFETs
Green, Ronald, Urciuoli, Damian, Lelis, Aivars J.Volume:
924
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/msf.924.715
Date:
June, 2018
File:
PDF, 1.19 MB
2018