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Thickness scaling of ferroelectricity in BiFeO 3 by tomographic atomic force microscopy
Steffes, James J., Ristau, Roger A., Ramesh, Ramamoorthy, Huey, Bryan D.Journal:
Proceedings of the National Academy of Sciences
DOI:
10.1073/pnas.1806074116
Date:
January, 2019
File:
PDF, 4.11 MB
2019