Efficient evaluation model including interconnect...

Efficient evaluation model including interconnect resistance effect for large scale RRAM crossbar array matrix computing

Han, Runze, Huang, Peng, Zhao, Yudi, Cui, Xiaole, Liu, Xiaoyan, Kang, Jinfeng
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Volume:
62
Language:
english
Journal:
Science China Information Sciences
DOI:
10.1007/s11432-018-9555-8
Date:
February, 2019
File:
PDF, 403 KB
english, 2019
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