Plan-view transmission electron microscopy specimen...

Ultramicroscopy 2019 / 02 Vol. 197

Plan-view transmission electron microscopy specimen preparation for atomic layer materials using a focused ion beam approach

Lee, Lan-Hsuan, Yu, Chia-Hao, Wei, Chuan-Yu, Lee, Pei-Chin, Huang, Jih-Shang, Wen, Cheng-Yen
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Volume:
197
Language:
english
Journal:
Ultramicroscopy
DOI:
10.1016/j.ultramic.2018.12.001
Date:
February, 2019
File:
PDF, 1.33 MB
english, 2019
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