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Measurement of the bending of thin inclined nanowires as a method for determining elastic modulus
Dunaevskiy, M S, Alekseev, P A, Geydt, P, Lahderanta, E, Haggren, T, Lipsanen, HVolume:
443
Language:
english
Journal:
IOP Conference Series: Materials Science and Engineering
DOI:
10.1088/1757-899X/443/1/012006
Date:
November, 2018
File:
PDF, 739 KB
english, 2018