Optical thickness identification of few-layer MoS...

Materials Research Express 2019 / 01 Vol. 6; Iss. 4

Optical thickness identification of few-layer MoS 2 deposited by chemical vapor deposition

Zhu, Zusong, Zhu, Dequan, Zhang, Jie, Jiang, Guisheng, Yi, Mingfang, Wen, Jun
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Volume:
6
Language:
english
Journal:
Materials Research Express
DOI:
10.1088/2053-1591/aafa4b
Date:
January, 2019
File:
PDF, 506 KB
english, 2019
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