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Roughness of the contact line on random self-affine rough surfaces
Iliev, Pavel, Pesheva, Nina, Iliev, StanimirVolume:
98
Language:
english
Journal:
Physical Review E
DOI:
10.1103/PhysRevE.98.060801
Date:
December, 2018
File:
PDF, 1.11 MB
english, 2018