![](/img/cover-not-exists.png)
[IEEE 2018 IEEE International Conference on Data Mining (ICDM) - Singapore, Singapore (2018.11.17-2018.11.20)] 2018 IEEE International Conference on Data Mining (ICDM) - Deep Knowledge Tracing and Dynamic Student Classification for Knowledge Tracing
Minn, Sein, Yu, Yi, Desmarais, Michel C., Zhu, Feida, Vie, Jill-JennYear:
2018
Language:
english
DOI:
10.1109/ICDM.2018.00156
File:
PDF, 335 KB
english, 2018