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[IEEE 2018 IEEE International Conference on Industrial Technology (ICIT) - Lyon (2018.2.20-2018.2.22)] 2018 IEEE International Conference on Industrial Technology (ICIT) - Design of an FPGA-based RRAM parameter measurement platform
Kaya, Z. E., Tekin, S. B., Kalem, S.Year:
2018
Language:
english
DOI:
10.1109/ICIT.2018.8352386
File:
PDF, 414 KB
english, 2018