[IEEE 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Singapore (2018.7.16-2018.7.19)] 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Characterization of Multilayered Ceramic Capacitors via Piezoelectric Force Microscopy
Pascual, Gerald, Lee, Cathy, Pineda, John Paul, Kim, Byong, Lee, KeibockYear:
2018
Language:
english
DOI:
10.1109/IPFA.2018.8452613
File:
PDF, 580 KB
english, 2018