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[IEEE 2018 IEEE International Semiconductor Laser Conference (ISLC) - Santa Fe, NM (2018.9.16-2018.9.19)] 2018 IEEE International Semiconductor Laser Conference (ISLC) - High-Power 638-nm AlInGaP Broad Area Laser Diode and its Reliability
Yagi, Tetsuya, Kuramoto, Kyosuke, Abe, Shinji, Miyashita, Motoharu, Nishida, TakehiroYear:
2018
Language:
english
DOI:
10.1109/ISLC.2018.8516141
File:
PDF, 336 KB
english, 2018