[IEEE 2018 IEEE International Power Electronics and Application Conference and Exposition (PEAC) - Shenzhen, China (2018.11.4-2018.11.7)] 2018 IEEE International Power Electronics and Application Conference and Exposition (PEAC) - Investigation of Temperature-Dependent Electrical Behavior and Trap Effect in AlGaN/GaN HEMT
Feng, FaMing, Chen, YiQiang, Xu, XinBin, Yu, YongTao, Wang, XiaoQiang, He, Jiang, Li, GuoYuanYear:
2018
Language:
english
DOI:
10.1109/PEAC.2018.8590227
File:
PDF, 276 KB
english, 2018