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Structural and electrical properties of ferroelectric BiFeO 3 /HfO 2 gate stack for nonvolatile memory applications
Yadav, Nitish, Pandey, Kamal Prakash, Tripathi, Pramod NarayanVolume:
8
Language:
english
Journal:
Journal of Advanced Dielectrics
DOI:
10.1142/s2010135x18500376
Date:
October, 2018
File:
PDF, 3.19 MB
english, 2018