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Kink Suppression and High Reliability of Asymmetric Dual Channel Poly-Si Thin Film Transistors for High Voltage Bias Stress
PARK, Joonghyun, SHIN, MyunghunVolume:
E102.C
Language:
english
Journal:
IEICE Transactions on Electronics
DOI:
10.1587/transele.E102.C.95
Date:
January, 2019
File:
PDF, 638 KB
english, 2019