Analysis of transistor damage mechanism and protection...

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International Journal of Applied Electromagnetics and Mechanics 2018 / 12

Analysis of transistor damage mechanism and protection measures under lightning voltage

Li, Xiangchao, Wan, Zhicheng, Liu, Yinping, Ma, Xiaoqi, Cai, Lujin, Xu, Xiaopei
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Language:
english
Journal:
International Journal of Applied Electromagnetics and Mechanics
DOI:
10.3233/JAE-180092
Date:
December, 2018
File:
PDF, 928 KB
english, 2018
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