Dynamic Measurement Error Modeling and Analysis in a Photoelectric Scanning Measurement Network
Shi, Shendong, Yang, Linghui, Lin, Jiarui, Long, Changyu, Deng, Rui, Zhang, Zhenyu, Zhu, JiguiVolume:
9
Language:
english
Journal:
Applied Sciences
DOI:
10.3390/app9010062
Date:
December, 2018
File:
PDF, 5.30 MB
english, 2018