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Negative capacitance phenomena depending on the wake-up effect in the ferroelectric Si:HfO2 film
Park, Sanghyun, Chun, Min Chul, Park, Solmin, Park, Ga-yeon, Jung, Moonyoung, Noh, Youngji, Ahn, Seung-Eon, Kang, Bo SooLanguage:
english
Journal:
Current Applied Physics
DOI:
10.1016/j.cap.2018.12.017
Date:
December, 2018
File:
PDF, 1.41 MB
english, 2018