[IEEE 2018 IEEE International Semiconductor Laser Conference (ISLC) - Santa Fe, NM (2018.9.16-2018.9.19)] 2018 IEEE International Semiconductor Laser Conference (ISLC) - Beam Quality Improvement of Broad-Area Laser Diodes by Symmetric Facet Reflectivities
Rauch, Simon, Modak, Prasanta, Holly, Carlo, Zimer, HagenYear:
2018
Language:
english
DOI:
10.1109/ISLC.2018.8516193
File:
PDF, 193 KB
english, 2018