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[AIP 26th Annual review of progress in quantitative nondestrictive evaluation - Montreal (Canada) (25-30 July 1999)] AIP Conference Proceedings - Printed circuit board (PCB) hole metallization quality testing
Kaspari, R.Volume:
509
Year:
2000
DOI:
10.1063/1.1291306
File:
PDF, 551 KB
2000