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Deep learning-based digital in-line holographic microscopy for high resolution with extended field of view
Byeon, Hyeokjun, Go, Taesik, Lee, Sang JoonVolume:
113
Language:
english
Journal:
Optics & Laser Technology
DOI:
10.1016/j.optlastec.2018.12.014
Date:
May, 2019
File:
PDF, 2.70 MB
english, 2019