Characterization of the morphology of titanium and titanium...

Thin Solid Films 2019 / 02 Vol. 671

Characterization of the morphology of titanium and titanium (IV) oxide nanolayers deposited on different substrates by application of grazing incidence X-ray diffraction and X-ray reflectometry techniques

Stabrawa, I., Kubala-Kukuś, A., Banaś, D., Pepponi, G., Braziewicz, J., Pajek, M., Teodorczyk, M.
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Volume:
671
Language:
english
Journal:
Thin Solid Films
DOI:
10.1016/j.tsf.2018.12.034
Date:
February, 2019
File:
PDF, 1.41 MB
english, 2019
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