Chemical imaging of buried interfaces in organic-inorganic...

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ACS Applied Materials & Interfaces 2019 / 01

Chemical imaging of buried interfaces in organic-inorganic devices using FIB-ToF-SIMS

Tiddia, Mariavitalia, Mihara, Ichiro, Seah, Martin P, Trindade, Gustavo Ferraz, Kollmer, Felix, Roberts, Clive J, Hague, Richard J.M., Mula, Guido, Gilmore, Ian S, Havelund, Rasmus
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Language:
english
Journal:
ACS Applied Materials & Interfaces
DOI:
10.1021/acsami.8b15091
Date:
January, 2019
File:
PDF, 776 KB
english, 2019
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