Investigation of laser-induced damage at 248 nm in oxide thin films with a pulsed photoacoustic mirage technique
Siegel, J., Reichling, M., Matthias, E., Hacker, E., Lauth, H.Volume:
4
Language:
english
Journal:
Le Journal de Physique IV
DOI:
10.1051/jp4:19947175
Date:
July, 1994
File:
PDF, 732 KB
english, 1994