Interleaved atom interferometry for high-sensitivity...

Interleaved atom interferometry for high-sensitivity inertial measurements

Savoie, D., Altorio, M., Fang, B., Sidorenkov, L. A., Geiger, R., Landragin, A.
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Volume:
4
Language:
english
Journal:
Science Advances
DOI:
10.1126/sciadv.aau7948
Date:
December, 2018
File:
PDF, 1008 KB
english, 2018
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