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[IEEE 2018 3rd International Conference on Pattern Analysis and Intelligent Systems (PAIS) - Tebessa, Algeria (2018.10.24-2018.10.25)] 2018 3rd International Conference on Pattern Analysis and Intelligent Systems (PAIS) - Relative scientometric analysis of knowledge management journals in SCOPUS
Aitouche, Samia, Brahmi, Samira, Zermane, Hanane, Zerari, Naima, Latreche, Khaled, Kaanit, AbdelghafourYear:
2018
Language:
english
DOI:
10.1109/PAIS.2018.8598512
File:
PDF, 588 KB
english, 2018