Reduced-code static linearity test of split-capacitor SAR...

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IEEE Transactions on Device and Materials Reliability 2019

Reduced-code static linearity test of split-capacitor SAR ADCs using an embedded incremental ΔΣ converter

Feitoza, Renato S., Barragan, Manuel J., Dzahini, Daniel, Mir, Salvador
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Year:
2019
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/TDMR.2019.2891298
File:
PDF, 4.12 MB
english, 2019
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