Epitaxial growth and dielectric characterization of...

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films 2019 / 01 Vol. 37; Iss. 1

Epitaxial growth and dielectric characterization of atomically smooth 0.5Ba(Zr 0.2 Ti 0.8 )O 3 –0.5(Ba 0.7 Ca 0.3 )TiO 3 thin films

Liu, Yang, Wang, Zheng, Thind, Arashdeep Singh, Orvis, Thomas, Sarkar, Debarghya, Kapadia, Rehan, Borisevich, Albina Y., Mishra, Rohan, Khan, Asif Islam, Ravichandran, Jayakanth
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Volume:
37
Language:
english
Journal:
Journal of Vacuum Science & Technology A
DOI:
10.1116/1.5054130
Date:
January, 2019
File:
PDF, 4.69 MB
english, 2019
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