An Atomistic Study on Hydrogenation Effects toward Quality Improvement of Program/Erase Cycle of MONOS-Type Memory
OTAKE, Akira, YAMAGUCHI, Keita, KAMIYA, Katsumasa, SHIGETA, Yasuteru, SHIRAISHI, KenjiVolume:
E94-C
Year:
2011
Language:
english
Journal:
IEICE Transactions on Electronics
DOI:
10.1587/transele.e94.c.693
File:
PDF, 1.10 MB
english, 2011