[IEEE 2018 IEEE International Test Conference (ITC) - Phoenix, AZ, USA (2018.10.29-2018.11.1)] 2018 IEEE International Test Conference (ITC) - EMFORCED: EM-based Fingerprinting Framework for Counterfeit Detection with Demonstration on Remarked and Cloned ICs
Stern, Andrew, Botero, Ulbert, Shakya, Bicky, Shen, Haoting, Forte, Domenic, Tehranipoor, MarkYear:
2018
DOI:
10.1109/test.2018.8624679
File:
PDF, 9 KB
2018