[IEEE 2018 IEEE International Test Conference (ITC) -...

  • Main
  • [IEEE 2018 IEEE International Test...

[IEEE 2018 IEEE International Test Conference (ITC) - Phoenix, AZ, USA (2018.10.29-2018.11.1)] 2018 IEEE International Test Conference (ITC) - EMFORCED: EM-based Fingerprinting Framework for Counterfeit Detection with Demonstration on Remarked and Cloned ICs

Stern, Andrew, Botero, Ulbert, Shakya, Bicky, Shen, Haoting, Forte, Domenic, Tehranipoor, Mark
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2018
DOI:
10.1109/test.2018.8624679
File:
PDF, 9 KB
2018
Conversion to is in progress
Conversion to is failed