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IP determination and 1+1 REMPI spectrum of SiO at 210–220 nm in an ion trap: Implications for SiO+ ion trap loading
Stollenwerk, Patrick R., Antonov, Ivan O., Odom, Brian C.Volume:
355
Journal:
Journal of Molecular Spectroscopy
DOI:
10.1016/j.jms.2018.11.008
Date:
January, 2019
File:
PDF, 564 KB
2019