Circuit analysis to predict humidity related failures in...

Microelectronics Reliability 2019 / 02 Vol. 93

Circuit analysis to predict humidity related failures in electronics - Methodology and recommendations

Joshy, Salil, Verdingovas, Vadimas, Jellesen, Morten Stendahl, Ambat, Rajan
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Volume:
93
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2018.12.010
Date:
February, 2019
File:
PDF, 488 KB
2019
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