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[IEEE 29th International Reliability Physics Symposium - Las Vegas, NV, USA (1991.04.9-1991.04.11)] 29th International Reliability Physics Symposium - AC Hot-Carrier Effects in Scaled MOS Devices
Takeda, Eiji, Izawa, Ryuichi, Umeda, Kazunori, Nagai, RyoYear:
1991
DOI:
10.1109/irps.1991.363221
File:
PDF, 3 KB
1991