Critical impact of gate dielectric interfaces on the trap...

Materials Science in Semiconductor Processing 2019 / 03 Vol. 91

Critical impact of gate dielectric interfaces on the trap states and cumulative charge of high-performance organic thin field transistors

Lin, Hui, Zhao, Wenqiang, Kong, Xiao, Li, Lijuan, Li, Yimeng, Kuang, Peng, Zhang, Yi, Zhang, Landan, Sun, Ming, Tao, Silu
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Volume:
91
Language:
english
Journal:
Materials Science in Semiconductor Processing
DOI:
10.1016/j.mssp.2018.11.019
Date:
March, 2019
File:
PDF, 1.74 MB
english, 2019
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