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[IEEE 2018 33rd Symposium on Microelectronics Technology and Devices (SBMicro) - Bento Gonçalves (2018.8.27-2018.8.31)] 2018 33rd Symposium on Microelectronics Technology and Devices (SBMicro) - Back bias impact on effective mobility of p-type nanowire SOI MOSFETs
Paz, Bruna Cardoso, Casse, Mikael, Barraud, Sylvain, Reimbold, Gilles, Vinet, Maud, Faynot, Olivier, Pavanello, Marcelo AntonioYear:
2018
DOI:
10.1109/SBMicro.2018.8511505
File:
PDF, 7 KB
2018